Reflectometers
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We are proud to represent Bruker Nano, Inc., manufacturers of advanced semiconductor metrology systems.
Bruker is a leading innovator and provider of the advanced FilmTek™ metrology systems and analysis software to major companies in the semiconductor, optoelectronics, data storage, display, MEMS, and optical coating industries.
Our mission is to solve our clients’ most critical metrology challenges by providing leading-edge solutions to precisely suit their requirements. We value close cooperation and long-term partnership to understand and anticipate your current and future needs.
To meet these demands, our expanding technology suite of multi-modal metrology systems includes multi-angle spectroscopic ellipsometry, polarized reflectometry, transmission, and scatterometry. Our complete product portfolio serves our clients throughout the entire product life cycle, from research and development to high-volume production. We are dedicated to building custom solutions, as needed, to solve your specific requirements.
An extensive portfolio of key patents is held allowing for the highest index measurement accuracy in the industry, with a resolution 100 times better than existing tools. We continue to pioneer new technology in high-precision optical design and software modelling. Our technology is deployed in the world’s leading development and production facilities in a broad range of industries.
We can supply the following range of Bruker FilmTek™ systems for Multi-angle Reflectometry & Ellipsometry measurements.
Production-proven metrology system for film thickness, refractive index and stress measurement for a broad range of film layers at the 1x design node and beyond. Accommodates 200 or 300 mm wafer metrology.
Combines spectroscopic ellipsometry and DUV multi-angle polarized reflectometry with a wide spectral range to meet the challenging demands associated with multi-patterning and other leading-edge device fabrication techniques
Fully-automated wafer metrology optimized for photonic integrated circuit manufacturing. Delivers unmatched measurement accuracy, with a 100x performance advantage over the best non-contact method and 10x that of the best prism coupler contact systems.
Designed to enable optical component manufacturers to increase functional yield of their products, reliably and at lower cost.
Engineered to meet the needs of any advanced thin film measurement application, excelling at material characterization on both transparent and non-transparent substrates.
Combines spectroscopic ellipsometry, DUV multi-angle polarized reflectometry, and transmission measurement with a wide spectral range to meet the most challenging of measurement demands in both R&D and production.
Patented parabolic mirror technology allows for a small spot size down to 50µm, ideal for direct measurement of product wafers and patterned films.
Our most advanced benchtop metrology solution, engineered to meet the needs of nearly any advanced thin film measurement application, from R&D to production.
Combines spectroscopic ellipsometry and DUV multi-angle polarized reflectometry with a wide spectral range to deliver the highest accuracy, precision, and versatility in the industry.
Patented parabolic mirror technology allows for a small spot size down to 50µm, ideal for direct measurement of product wafers and patterned films.
Benchtop metrology system delivering unmatched measurement performance, versatility, and speed for unpatterned thin to thick film applications. Ideally suited for academic and R&D settings.
Combines spectroscopic rotating compensator ellipsometry, multi-angle polarized spectroscopic reflection, and transmission measurement capabilities to meet the needs of nearly any flat panel display application.
Benchtop metrology system delivering unmatched measurement performance, versatility, and speed for unpatterned thin to thick film applications. Ideally suited for academic and R&D settings.
Combines spectroscopic rotating compensator ellipsometry, multi-angle polarized spectroscopic reflection, and intuitive material modeling software to make even the most demanding of measurement tasks simple and reliable.
Charntec Electronics provides sales and service support to manufacturers in the semiconductor, and allied industries based in the UK, Ireland and Europe and is proud to be celebrating its 44th year in 2023.
PO Box 477
Eastleigh
SO50 0AR
UK